Jang, Hari; Shin, Sang Eon; Youm, Kyu Jin; Karagozlu, Mustafa Zafer; Kim, Chang Bae; Ko, Kwang Soo; Park, Seong Hwan
ArticleIssue Date2020CitationJournal of Forensic Sciences, v.65, no.1, pp 283 - 287PublisherAmerican Society for Testing and Materials